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ILI Detection and Measurement of Elevated Stresses at Crack Locations

March 3, 2022March 3, 2022 by novitech-dev

 Novitech’s Micron IDD-SM® sensor technology is changing crack integrity management. This new methodology of stress measurement facilitates more accurate ranking of crack severity. 

As shown below, the AMFL responses to circumferential stress corrosion cracking (CSCC) remains constant while the responses from the IDD-SM sensor technology clearly shows the increasing signal amplitudes as the applied bending force increases from zero through to 64% of SMYS. 

We have over 120 field and metallurgical verified CSCC detected and sized using our Micron ILI Technology®. The probability of detection (POD) and probability of identification (POI) for these verifications has been found to be greater than 90%. 

Our work now includes looking at axial, and off angle cracking. Crack monitoring can also be considered as an integrity management option with the precision and repeatability of AMFL, CMFL, Geometry and IDD-SM sensor systems (#SCC, # CSCC). 

For more information, please refer to our 2022 PPIM paper “Detection and measurement of elevated stress associated with CSCC“ or contact us at [email protected] 

ILI Detection and Measurement of Elevated Stresses at Crack Locations

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Ron Thompson, Senior Vice President:
Phone: ( 647 )-527-7235
Guillermo Solano, P.Eng
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Phone: ( 416 )-580-8126
[email protected]

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