Our Micron MFL based crack detection tools with dual geometry & IDD-SM modules have taken pipeline inspections to the next level.
Novitech’s industry leading AMFL tools can sample over 600x per square inch & our CMFL tools can sample over 1000x per square inch. When coupled with dual Geometry & IDD-SM modules, a combined sampling density of over 2000 per square inch, can be attained.
Our IDD-SM sensors arrays a 0.200” (5mm) resolution that have been designed & optimized to detect elevated stress at both axial & circumferential crack locations. This innovation, allows crack detection with a POD (probability of detection) & POI (probability of identification) greater than 90%.
The new dual geometry modules, allow deformation inspections with a resolution of 0.400” (10mm) which is the highest resolution that has been achieved in the industry.
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Come by and visit us at booths 514-516 on Tuesday February 1st, through Thursday February 3rd at George R. Brown Convention Center, 1001 Avenida De Las Americas, Houston TX.
For more information, please do not hesitate to contact us at info@novitechinc.com